New
Arrivals/Restock
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)
4.6 (60 items)
Limited Time SaleUntil the end
15
26
05
US$72.01 cheaper than the new price!!
Free shipping for purchases over $99 ( Details )
Free cash-on-delivery fees for purchases over $99
Free cash-on-delivery fees for purchases over $99
See all stores
Please note that the sales price and tax displayed may differ between online and in-store. Also, the product may be out of stock in-store.
Used US$48.00
Product details
| Management number | 233377762 | Release Date | 2026/06/27 | List Price | US$48.00 | Model Number | 233377762 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. Read more
| ISBN10 | 1402083629 |
|---|---|
| ISBN13 | 978-1402083624 |
| Edition | 2008th |
| Language | English |
| Publisher | Springer |
| Dimensions | 6.14 x 0.67 x 9.21 inches |
| Item Weight | 1 pounds |
| Print length | 212 pages |
| Part of series | Frontiers in Electronic Testing |
| Publication date | June 21, 2008 |
Bestseller ranking
Battery Testers
Customers who viewed this product also viewed
Design
Correction of product information
If you notice any omissions or errors in the product information on this page, please use the correction request form below.
Correction Request Form